Configuration measuring method and apparatus for optically detec

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250306, H01J 314

Patent

active

056169167

ABSTRACT:
Substantially collimated displacement detection light is led to a first lens and condensed by the first lens to proximities to a reflecting surface of a probe. The reflected light is displaced by an atomic force acting against a surface of a sample, where the reflected light varies in reflection angle according to the displacement. The displaced light is lead to the first lens, changed in direction by a mirror, and detected by magnifying the displacement of the probe. The detection further includes steps of moving a Z direction scan block in a direction vertical to the sample surface by a Z direction driving device, the Z direction scan block having the first lens and the probe, moving an X direction scan block in a first axial direction within a plane parallel to the sample surface by an X direction driving device, the X direction scan block having the Z direction scan block, the Z direction driving device, and the mirror, and moving a Y direction scan block by a Y direction driving device in a second axial direction perpendicular to the first axial direction within a plane parallel to the sample surface, the Y direction scan block having the X direction scan block, the X direction driving device, the detection light radiation system, and the displacement detection system.

REFERENCES:
patent: Re33387 (1990-10-01), Binnig
patent: 5135715 (1992-10-01), Ueyema et al.
patent: 5294804 (1994-03-01), Kajimura
patent: 5394741 (1995-03-01), Kajimura et al.
patent: 5408094 (1995-04-01), Kajimura

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Configuration measuring method and apparatus for optically detec does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Configuration measuring method and apparatus for optically detec, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Configuration measuring method and apparatus for optically detec will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-541465

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.