Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-03-11
2008-03-11
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S105000, C365S149000, C365S194000, C365S189050, C330S051000, C333S017300
Reexamination Certificate
active
11602922
ABSTRACT:
A configurable semiconductor has a device characteristic that is controllable as a function of at least one external impedance. A measurement circuit measures an electrical characteristic of the at least one external impedance and determines a select value corresponding to the measured electrical characteristic. A first circuit controls the device characteristic as a function of the select value.
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Marvell International Ltd.
Tsai Carol S. W.
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