Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-04-24
2007-04-24
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S105000, C365S149000, C365S194000, C365S189050
Reexamination Certificate
active
11411377
ABSTRACT:
A method selects a group of values for an external impedance used to configure a semiconductor. The external impedance has a tolerance and the group of values include a quantity. The method includes providing a measurement circuit as a portion of the semiconductor; determining tolerances associated with the measurement circuit; selecting one of the external impedance tolerance and the quantity of the group of values; computing the other of the external impedance tolerance and the quantity of the group of values, as a function of the measurement circuit tolerances and the selected one of the external impedance tolerance and the quantity of the group of values; and selecting discrete values for the group of values of the external impedance as a function of the computing.
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Marvell Internation Ltd.
Tsai Carol S. W.
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