Conductor-pattern testing method, and electro-optical device

Details Conductor-pattern testing method, and electro-optical device Conductor-pattern testing method, and electro-optical device

2006-05-23

2006-05-23

Cuneo, Kamand (Department: 2841)

Electricity: conductors and insulators

Conduits, cables or conductors

Preformed panel circuit arrangement

C361S767000, C361S777000

Reexamination Certificate

active

07049527

ABSTRACT:
A conductor pattern having both elongated conductors and a dummy pattern is formed on a substrate. The dummy pattern is formed of dummy conductors. The elongated conductors are typically transparent electrodes. The dummy pattern is so configured that each of the dummy conductors are mutually set apart with a spacing as appropriate in the extending direction (top-and-bottom direction) and in the array direction (right-and-left direction) of the transparent electrodes to prevent any two inspection probes from contacting a single dummy conductor.

REFERENCES:
patent: 5406398 (1995-04-01), Suzuki et al.
patent: 6165692 (2000-12-01), Kanai et al.
patent: 08-211398 (1996-08-01), None
Communication from Japanese Patent Office regarding counterpart application.

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