Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-01-10
2006-01-10
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S761010
Reexamination Certificate
active
06985820
ABSTRACT:
A method for analyzing input output (I/O) pin arrangements to determine the effect of differential pair and power and ground pin placement on signal quality which includes constructing an array of pins, arranging a plurality of differential pairs within the array of pins to provide a pin arrangement, exciting each of the differential pairs within the pin arrangement, monitoring coupled noise on other differential pairs within the pin arrangement, and analyzing the pin arrangement based upon the monitoring.
REFERENCES:
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patent: 5486766 (1996-01-01), Hibdon et al.
patent: 5596269 (1997-01-01), Miller et al.
patent: 6100815 (2000-08-01), Pailthorp
patent: 6198297 (2001-03-01), Riccioni
patent: 6933853 (2005-08-01), Barr et al.
patent: 2004/0249585 (2004-12-01), Barr et al.
Hamilton & Terrile LLP
Hoff Marc S.
Kim Paul
Sun Microsystems Inc.
Terrile Stephen A.
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