Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1988-10-25
1991-11-26
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324692, 324358, G01R 2702
Patent
active
050686194
ABSTRACT:
A conductivity measuring device comprises a low-potential intermediate electrode which is capable of being in connected state by a switch and which is disposed between a couple of measuring electrodes for transmitting and receiving. Each of said electrodes is made contact with a body to be tested so that the conductivities of the surface and the inner portion of said body to be tested can be measured, respectively.
REFERENCES:
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patent: 3319158 (1967-05-01), McDoulett
patent: 3382428 (1968-05-01), Sherwood
patent: 4041372 (1977-08-01), Miller
patent: 4446424 (1984-05-01), Chatanier
patent: 4467283 (1984-08-01), Owen
patent: 4546310 (1985-10-01), Chatanier
patent: 4553087 (1985-11-01), Kuhn
Matsushita Akira
Nakano Shohkichi
Matsushita Akira
Nihon System Research Institute Inc.
Solis Jose M.
Wieder Kenneth A.
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