Conductive trace with reduced RF impedance resulting from...

Details Conductive trace with reduced RF impedance resulting from... Conductive trace with reduced RF impedance resulting from...

2011-08-23

2011-08-23

Im, Junghwa M (Department: 2811)

Active solid-state devices (e.g., transistors, solid-state diode

Integrated circuit structure with electrically isolated...

Passive components in ics

C257S781000, C257S528000, C257S774000, C257S758000, C257SE23158

Reexamination Certificate

active

08004061

ABSTRACT:
The radio frequency (RF) impedance of a metal trace at gigahertz frequencies is reduced by forming the metal trace to have a base region and a number of fins that extend away from the base region. When formed in a spiral configuration having a number of loops, the metal trace forms an inductor with an increased quality factor (Q).

REFERENCES:
patent: 3573540 (1971-04-01), Osepchuk
patent: 4165558 (1979-08-01), Armitage, Jr. et al.
patent: 4541893 (1985-09-01), Knight
patent: 5434094 (1995-07-01), Kobiki et al.
patent: 5472901 (1995-12-01), Kapoor
patent: 5741741 (1998-04-01), Tseng
patent: 5952704 (1999-09-01), Yu et al.
patent: 5976972 (1999-11-01), Inohara et al.
patent: 5986346 (1999-11-01), Katoh
patent: 5998299 (1999-12-01), Krishnan
patent: 6051470 (2000-04-01), An et al.
patent: 6104055 (2000-08-01), Watanabe
patent: 6107177 (2000-08-01), Lu et al.
patent: 6150725 (2000-11-01), Misawa et al.
patent: 6191023 (2001-02-01), Chen
patent: 6197682 (2001-03-01), Drynan et al.
patent: 6218302 (2001-04-01), Braeckelmann et al.
patent: 6232215 (2001-05-01), Yang
patent: 6251740 (2001-06-01), Johnson et al.
patent: 6258720 (2001-07-01), Gris
patent: 6277727 (2001-08-01), Kuo et al.
patent: 6281135 (2001-08-01), Han et al.
patent: 6310386 (2001-10-01), Shenoy
patent: 6326673 (2001-12-01), Liou
patent: 6362012 (2002-03-01), Chi et al.
patent: 6395637 (2002-05-01), Park et al.
patent: 6413832 (2002-07-01), Wu et al.
patent: 6417087 (2002-07-01), Chittipeddi et al.
patent: 6437385 (2002-08-01), Bertin et al.
patent: 6444517 (2002-09-01), Hsu et al.
patent: 6452247 (2002-09-01), Gardner
patent: 6495469 (2002-12-01), Yang et al.
patent: 6566242 (2003-05-01), Adams et al.
patent: 6613668 (2003-09-01), Meijer et al.
patent: 6664581 (2003-12-01), Stamper
patent: 6703710 (2004-03-01), Hopper et al.
patent: 6740956 (2004-05-01), Hopper et al.
patent: 6750750 (2004-06-01), Jiong et al.
patent: 6853079 (2005-02-01), Hopper et al.
patent: 6864581 (2005-03-01), Hopper et al.
patent: 7098044 (2006-08-01), Hopper et al.
patent: 7223680 (2007-05-01), Hopper et al.
patent: 7271465 (2007-09-01), Jessie et al.
patent: 7309639 (2007-12-01), Hopper et al.
patent: 2002/0024150 (2002-02-01), Farrar
patent: 2002/0105405 (2002-08-01), Lee et al.
patent: 2002/0151165 (2002-10-01), Chung
patent: 2003/0170989 (2003-09-01), Bothra
patent: 2004/0140526 (2004-07-01), Jiong et al.
patent: 2007/0026659 (2007-02-01), Chinthakindi et al.
Hopper et al, U.S. Appl. No. 11/403,123, filed Apr. 12, 2006.
Hopper et al, U.S. Appl. No. 11/013,490, filed Dec. 15, 2004.
U.S. Appl. No. 11/013,490 to Hopper et al filed Dec. 15, 2004.
U.S. Appl. No. 11/403,123 to Hopper et al filed Apr. 12, 2006.
U.S. Appl. No. 11/013,490, filed Dec. 15, 2004 to Peter J. Hopper et al.

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