Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent
1980-01-21
1982-07-27
Yasich, Daniel M.
Electricity: measuring and testing
Conductor identification or location
Inaccessible
324 51, 361212, 374158, G01R 3102, G01K 722
Patent
active
043419925
ABSTRACT:
Several improvements are disclosed for the design of a protective cover for the probe component of an electronic thermometer. In one embodiment, the probe cover is formed of a thin layer of synthetic resin material having a conductive material dispersed therein to render the cover electrically conductive. A verification circuit in the electronic thermometer utilizes the conductivity of the cover to ascertain that the probe cover is properly positioned on the probe. In one embodiment, the resistance of the probe cover is measured along its length, and the verification circuit includes an enabling circuit to allow the thermometer to operate only if the measured resistance is between predetermined upper and lower ohmic limits. In another embodiment of the present invention, the probe cover retainer element is split into two conductive portions, and the resistance of the probe cover bridging those two portions is measured to ascertain that the probe cover is properly positioned on the probe. In each of these embodiments, the conductive probe cover is electrically grounded to provide for the discharge of static electrical charges from the conductive cover. In another disclosed embodiment of the present invention, a ring of reinforcing material is provided around the opening of the probe cover to provide for the secure retention of the cover on the probe.
REFERENCES:
patent: 902753 (1908-11-01), Marshall
patent: 2475356 (1949-07-01), Meschter
patent: 3192474 (1965-06-01), Cherry
patent: 3254533 (1966-06-01), Tongret
patent: 3367186 (1968-02-01), Ensign et al.
patent: 3461724 (1969-08-01), Tong et al.
patent: 3650153 (1972-03-01), Schwab
patent: 3677680 (1972-08-01), Etherington
patent: 3681991 (1972-08-01), Eberly, Jr.
patent: 3719576 (1973-03-01), Macur
patent: 3738172 (1973-06-01), Sato
patent: 3738479 (1973-06-01), Sato
patent: 3822593 (1974-07-01), Oudewaal
patent: 3905232 (1975-09-01), Knute
patent: 3929018 (1975-12-01), Turner
patent: 3978325 (1976-08-01), Goldstein et al.
patent: 3987899 (1976-10-01), Vyprachticky
patent: 3999434 (1976-12-01), Yen
patent: 4007832 (1977-02-01), Paull et al.
patent: 4008614 (1977-02-01), Turner et al.
patent: 4022063 (1977-05-01), West et al.
patent: 4068526 (1978-01-01), Goldstein
patent: 4095467 (1978-06-01), McGlynn
patent: 4117926 (1978-10-01), Turner et al.
patent: 4166389 (1979-09-01), Montren
patent: 4169243 (1979-09-01), Payne et al.
patent: 4231901 (1980-11-01), Berbeco
Control Electronics Co., Inc.
Yasich Daniel M.
LandOfFree
Conductive probe cover does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Conductive probe cover, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Conductive probe cover will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2026919