Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-02-15
2005-02-15
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S755090, C324S757020
Reexamination Certificate
active
06856151
ABSTRACT:
A contact system for electrically engaging semiconductor components includes an interface board mountable to an automated test handler, and a floating substrate on the interface board. The interface board includes interface contacts in electrical communication with external test circuitry. The substrate includes flexible segments, and contactors having contact pads on opposing sides of the flexible segments configured to simultaneously electrically engage terminal contacts on the components, and the interface contacts on the interface board. The contact pads include conductive polymer layers that provide an increased compliancy for the contactors. This increased compliancy allows the contactors to accommodate variations in the dimensions and planarity of the terminal contacts on the component. In addition, the substrate includes grooves between the contactors which provide electrical isolation and allow the contactors to move independently of one another. An alternate embodiment contact system includes a Z-axis conductive polymer layer between the substrate and the interface board. Also provided are test methods employing the contact systems.
REFERENCES:
patent: 3767519 (1973-10-01), Kojima et al.
patent: 4833402 (1989-05-01), Boegh-Petersen
patent: 5163834 (1992-11-01), Chapin et al.
patent: 5302891 (1994-04-01), Wood et al.
patent: 5317255 (1994-05-01), Suyama et al.
patent: 5492863 (1996-02-01), Higgins, III
patent: 5574382 (1996-11-01), Kimura
patent: 5798655 (1998-08-01), Kazama et al.
patent: 5813870 (1998-09-01), Gaynes et al.
patent: 5894217 (1999-04-01), Igarashi et al.
patent: 5945834 (1999-08-01), Nakata et al.
patent: 6046599 (2000-04-01), Long et al.
patent: 6064217 (2000-05-01), Smith
patent: 6064218 (2000-05-01), Godfrey et al.
patent: 6072324 (2000-06-01), Farnworth
patent: 6091256 (2000-07-01), Long et al.
patent: 6114864 (2000-09-01), Soejima et al.
patent: 6259036 (2001-07-01), Farnworth
patent: 6329829 (2001-12-01), Farnworth et al.
patent: 6333555 (2001-12-01), Farnworth et al.
patent: 6462568 (2002-10-01), Cram
patent: 6483329 (2002-11-01), Cram
patent: 6489794 (2002-12-01), Cram
patent: 6529026 (2003-03-01), Farnworth et al.
Gratton Stephen A.
Karlsen Ernest
Micro)n Technology, Inc.
LandOfFree
Conductive polymer contact system and test method for... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Conductive polymer contact system and test method for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Conductive polymer contact system and test method for... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3470615