Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Bump leads
Reexamination Certificate
2011-04-19
2011-04-19
Fourson, George (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Bump leads
C257S738000, C257S746000, C257SE23018
Reexamination Certificate
active
07928566
ABSTRACT:
Conductive bump (17) formed on a surface of electrode terminal (11) of an electronic component. Conductive bump (17) is composed of at least a plurality of cured resin materials having different conductive filler densities. Thus, a short circuit and a connection failure due to crush of conductive bump (17) at the time of mounting can be prevented.
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Yokoh, K. et al.,Super Juffit method. Electronic Packaging Technology. vol. 16, No. 9 (Sep. 2000). pp. 38-45 (with English translation).
Sakurai Daisuke
Yagi Yoshihiko
Fourson George
Panasonic Corporation
Wenderoth , Lind & Ponack, L.L.P.
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