Conductive bump, method for manufacturing the conductive...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Bump leads

Reexamination Certificate

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C257S738000, C257S746000, C257SE23018

Reexamination Certificate

active

07928566

ABSTRACT:
Conductive bump (17) formed on a surface of electrode terminal (11) of an electronic component. Conductive bump (17) is composed of at least a plurality of cured resin materials having different conductive filler densities. Thus, a short circuit and a connection failure due to crush of conductive bump (17) at the time of mounting can be prevented.

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International Search Report issued Feb. 5, 2008 in the International (PCT) Application PCT/JP2007/072423 of which the present application is the U.S. National Stage.
Yokoh, K. et al.,Super Juffit method. Electronic Packaging Technology. vol. 16, No. 9 (Sep. 2000). pp. 38-45 (with English translation).

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