Conduction-cooled accelerated test fixture

Details Conduction-cooled accelerated test fixture Conduction-cooled accelerated test fixture

2011-07-19

2011-07-19

Nguyen, Ha Tran T (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07982476

ABSTRACT:
According to one embodiment of the invention, a testing apparatus for executing highly accelerated life testing on at least one test subject includes at least one structure operable to thermally stress the test subject via conduction and at least one pneumatic hammer operable to input imparting vibrations to the test subject. According to another embodiment of the invention, a method for executing highly accelerated life testing of at least one test subject includes applying a thermal stress to the test subject via conduction at a rate of change of at least 8° C. per minute and imparting vibrations to the test subject at a rate of at least 3 Gs rms.

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European Search Report, Reference No. JL38114P.EPP; Application No./Patent No. 08250936.7-1254; 12 pages, Aug. 20, 2007.

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