Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2006-04-04
2006-04-04
Pert, Evan (Department: 2826)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
Reexamination Certificate
active
07022620
ABSTRACT:
A method is provided for forming polymer on an interior surface of a reaction chamber. A polymer-forming gas is introduced into the chamber and the environment is regulated to form the polymer on the interior surface of the chamber. Methods for the manufacture of integrated circuits, electronic devices, and electronic systems, are also provided.
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patent: 6350697 (2002-02-01), Richardson et al.
patent: 6776851 (2004-08-01), Singh et al.
patent: 2002/0086118 (2002-07-01), Chang et al.
Crane Bill
Gonzales John C.
Ott Steven
Polinsky William A.
Fletcher Yoder
Micro)n Technology, Inc.
Pert Evan
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