Condition monitoring in technical processes

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C702S187000, C700S175000

Reexamination Certificate

active

07113871

ABSTRACT:
The invention makes a contribution in order that machines and installations are better utilized, their service life is extended, reliability is improved, the loss of valuable materials is avoided, test results are optimized, and energy consumption is diminished. It is an expert system that acquires and assesses the condition of installations, machines and apparatuses. The mechanism proceeds from a normal condition and permanently observes short-term, medium-term and long-term changes. If variations in the normal condition are detected promptly, major instances of damage can be avoided by promptly performing corrective actions before major instances of damage associated with prolonged downtimes occur.

REFERENCES:
patent: 4456960 (1984-06-01), Wakai
patent: 5210704 (1993-05-01), Husseiny
patent: 5243533 (1993-09-01), Takagi et al.
patent: 6885972 (2005-04-01), Samata et al.
patent: 6928370 (2005-08-01), Anuzis et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Condition monitoring in technical processes does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Condition monitoring in technical processes, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Condition monitoring in technical processes will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3617593

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.