Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1994-07-25
1996-05-21
Gonzalez, Frank
Optics: measuring and testing
By particle light scattering
With photocell detection
356246, 359512, G01N 2100
Patent
active
055194907
ABSTRACT:
A particle counting device is improved to prevent adhesion impurities that result from condensation of condensation vapor on optical systems and the like in a particle detection area or the like of a measuring device to detect particles contained in the atmosphere or in certain gases and using condensation nuclei. In particular, in a particle measuring operation in which, in a chamber for saturated vapor that contains a liquid that can condense at a room temperature, a gas is added to a saturated vapor, the gas is introduced into a condensation part that is at a room temperature, the vapor is condensed on the particles as nuclei, and in which the particles, in a connected particle detection area, are measured, a heater is provided to keep the temperatures of the detection area, the connection pipe and the nozzle at least at a temperature higher than or equal to the temperature of the condensation part, to prevent adhesion impurities of condensation vapor on optical systems and the like in the detection area.
REFERENCES:
patent: 2684008 (1954-07-01), Vonnegut
patent: 3462609 (1969-08-01), Beattie
patent: 4790650 (1988-12-01), Keady
patent: 4914297 (1990-04-01), Wieboldt et al.
patent: 5026155 (1991-06-01), Ockovic et al.
patent: 5083865 (1992-01-01), Kinney et al.
Kamiya Seisaku
Nakata Shigenori
Sato Shintaro
Eisenberg Jason D.
Gonzalez Frank
Ushiodenki Kabushiki Kaisha
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