Data processing: measuring – calibrating – or testing – Calibration or correction system – Circuit tuning
Reexamination Certificate
2007-12-05
2008-10-21
Lau, Tung S (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Circuit tuning
C324S251000, C324S252000, C327S511000, C323S293000, C323S294000, C073S001150, C073S001480, C073S035110, C073S035130, C073S721000, C073S727000
Reexamination Certificate
active
07440861
ABSTRACT:
The inventive circuitry on a semiconductor chip includes a first functional element having a first electronic functional-element parameter that exhibits a dependence relating to the mechanical stress present in the semiconductor circuit chip in accordance with a first functional-element stress influence function. The first functional element provides a first output signal based on the first electronic functional-element parameter and mechanical stress. A second functional element has a second electronic functional-element parameter that exhibits a dependence in relation to the mechanical stress present in the semiconductor circuit chip in accordance with a second functional-element stress influence function. The second functional element is configured to provide a second output signal based on the second electronic functional-element parameter and the mechanical stress. A combiner combines the first and second output signals to obtain a resulting output signal exhibiting a predefined dependence on the mechanical stress present in the semiconductor circuit chip.
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Ausserlechner Udo
Motz Mario
Eschweiler & Associates LLC
Infineon - Technologies AG
Kundu Sujoy K
Lau Tung S
LandOfFree
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