Data processing: measuring – calibrating – or testing – Calibration or correction system – Circuit tuning
Reexamination Certificate
2005-01-17
2008-10-14
Lau, Tung S. (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Circuit tuning
C324S251000, C324S252000, C327S511000, C257S427000, C323S293000, C323S294000, C073S001150, C073S001480, C073S035110, C073S514340, C073S721000, C073S727000
Reexamination Certificate
active
07437260
ABSTRACT:
A semiconductor chip includes a first functional element having a first electronic functional-element parameter exhibiting a dependence relating to the mechanical stress present in the semiconductor circuit chip, and being configured to provide a first output signal, a second functional element having a second electronic functional-element parameter exhibiting a dependence in relation to the mechanical stress present in the semiconductor circuit chip, and being configured to provide a second output signal in dependence on the second electronic functional-element parameter and the mechanical stress, and a combination means for combining the first and second output signals to obtain a resulting output signal exhibiting a predefined dependence on the mechanical stress present in the semiconductor circuit chip, the first and second functional elements being integrated on the semiconductor circuit chip and arranged, geometrically, such that that the first and second functional-element stress influence functions are identical within a tolerance range.
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Ausserlechner Udo
Motz Mario
Eschweiler & Associates LLC
Infineon - Technologies AG
Kundu Sujoy K
Lau Tung S.
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