Computerized versatile and modular test system for electrical ci

Details Computerized versatile and modular test system for electrical ci Computerized versatile and modular test system for electrical ci

1982-04-13

1984-12-11

Smith, Jerry

Excavating

324 73AT, 324 73R, G06F 1100

Patent

active

044882998

ABSTRACT:
An address and data bus connects a multiplicity of ports into which test modules can be inserted with a microcomputer controlled by a keyboard for performing tests on circuit boards or other electronic units through test plugs that are interconnected with the data ports where the test modules are plugged in. When the test system is put into operation, all of the ports of the data bus are addressed to produce an indication of which ports are occupied by test modules as well as of the nature of the test modules. When it is desired to produce a test, each step of the procedure is performed by operation of a keyboard with reference to available options presented on the computer display on the basis of the configuration of test modules that have been plugged in. Coupling fields are interposed between data ports designed to receive test modules utilizing analog circuits and a test connector for connection to equipment under test. A coupling field has its own data port to enable switching the connection between the test module and the test plug to perform various tests under computer keyboard control. A wide variety of tests can be set up simply by manipulating the keyboard of the computer and the versatility of the system is still further increased by the possibility of plugging in the various kinds of test modules at different data ports and by interchanging the read-only memories of the microcomputer.

REFERENCES:
patent: 4044244 (1977-08-01), Foreman et al.
patent: 4055801 (1977-10-01), Pike et al.
patent: 4168796 (1979-09-01), Fulks et al.
patent: 4291404 (1981-09-01), Steiner
patent: 4393498 (1983-07-01), Jackson et al.
patent: 4397021 (1983-08-01), Lloyd et al.
patent: 4402055 (1983-08-01), Lloyd et al.

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