Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-12-11
2007-12-11
Barlow, Jr., John E. (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S118000
Reexamination Certificate
active
11051898
ABSTRACT:
A computer platform automatic testing method and system is proposed, which is designed for use in conjunction with a computer platform for performing an automatic testing procedure on a computer-dedicated circuit unit installed on the computer platform, and which is characterized by the capability of performing an automatic testing procedure on a computer-dedicated circuit unit based on a user-specified set of hardware specification data about the computer platform and circuit unit under test, and the capability of automatically generating a test report that lists related data about each faulted part of the circuit unit being tested. This feature allows hardware engineers to more conveniently and efficiently correct faulted parts in the circuit unit being tested.
REFERENCES:
patent: 5132635 (1992-07-01), Kennedy
patent: 5875293 (1999-02-01), Bell et al.
Chang Chi-Tsung
Lee Chia-Hsing
Lee Chun-Yi
Lu Ying-Chih
Wu Chin-Lung
Barlow Jr. John E.
Cherry Stephen J.
Corless Peter F.
Edwards Angell Palmer & & Dodge LLP
Inventec C'orporation
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