Computer controlled high-speed circuit for testing electronic de

Details Computer controlled high-speed circuit for testing electronic de Computer controlled high-speed circuit for testing electronic de

1980-05-28

1982-10-12

Strecker, Gerard R.

Electricity: measuring and testing

Plural, automatically sequential tests

371 1, 371 20, 371 25, G01R 1512, G01R 3102

Patent

active

RE0310565

ABSTRACT:
High-speed testing circuitry which, when coupled to one terminal of a multi-terminal electronic device, such as an integrated circuit, can either supply test stimuli signals up to a frequency of 30 MHz, receive output signals produced by the device under test in response to test stimuli signals applied by associated test circuits and compare these signals against computer predicted signals, or provide for parametric testing of the device.

REFERENCES:
patent: 3227889 (1966-01-01), Paynter
patent: 3976940 (1976-08-01), Chau et al.

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