Computer-aided probe with tri-state circuitry test capability

Electricity: measuring and testing – Plural – automatically sequential tests

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324 73AT, 371 20, 371 25, G01R 1332, G06F 1100

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active

047790423

ABSTRACT:
A probe is connected to a tri-state circuit which generates a programmable dc voltage to be impressed on a circuit node by the probed tip. Memory is provided for storing any change in tip voltage signifying a fault in the tri-state test. A separate circuit detects programmable data levels to eliminate gray area ambiguities. Further, a quick-check circuit determines whether a node is short circuited by determining whether toggling can occur at a node.

REFERENCES:
patent: 3513400 (1970-05-01), Russell
patent: 3525939 (1970-08-01), Cartmell
patent: 3543154 (1970-11-01), Gordon
patent: 3628141 (1971-12-01), Union et al.
patent: 3633100 (1972-01-01), Hellwell et al.
patent: 3662193 (1972-05-01), Braddock
patent: 3681614 (1972-08-01), Kroos
patent: 3683284 (1972-08-01), Mueller
patent: 3742351 (1973-06-01), Palmer et al.
patent: 3750015 (1973-07-01), Sheker et al.
patent: 3838339 (1974-09-01), Brandt
patent: 3845328 (1974-10-01), Hollingsworth
patent: 3903471 (1975-09-01), Hiraga et al.
patent: 3944921 (1976-03-01), Tsuda et al.
patent: 3952247 (1976-04-01), Horichi
patent: 4016492 (1977-04-01), Miller, Jr. et al.
patent: 4038598 (1977-07-01), Kapfer
patent: 4145651 (1979-03-01), Ripingill, Jr.
patent: 4189673 (1980-02-01), Shintaku
patent: 4291356 (1981-09-01), Mathieu
patent: 4403183 (1983-09-01), Lueker
patent: 4418314 (1983-11-01), Nieto, Jr.
patent: 4465944 (1984-08-01), Shin
patent: 4480200 (1984-10-01), Tan et al.
IBM Technical Disclosure Bulletin, "TIL/FET Logic Probe Front-End Circuitry," vol. 17, No. 11, Apr. 1975, pp. 3379-3380.
IBM Technical Disclosure Bulletin, "Universal Probe Point," vol. 19, No. *, Jan. 1977, pp. 2830-2831.

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