Image analysis – Applications
Patent
1997-07-29
2000-03-21
Chang, Jon
Image analysis
Applications
378 21, 382131, 382293, 600407, G06K 900, A61B 600
Patent
active
060411325
ABSTRACT:
A method of computed tomographic inspection which uses a Euclidian reference ply model having a corresponding Non-Euclidian ply model which includes reference model plies to extract intensity data from Euclidian slice data (typically having a pixel format) derived from multiple slice X-ray scans using an X-ray scanning system such as the CT system. The multiple slice data is analyzed to determine intensity values for points corresponding to a subject ply of a corresponding reference model ply. The reference model may be a predetermined model such as a mathematically described CAD model file or based on such a CAD model. A preferred method of the present invention includes a transformation of the CAD model data to register the CAD model data to multiple slice data of a standardized object to generate the reference model. Intensity values preferably gray scale pixel values are assigned to points on the reference ply model from the slice data and displayed as a Non-Euclidian image on a monitor.
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Isaacs Ralph G.
Portaz Joseph M.
Chang Jon
General Electric Company
Gressel Gerry S.
Hess Andrew C.
Patel Jayanti K.
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