Data processing: measuring – calibrating – or testing – Calibration or correction system
Reexamination Certificate
2004-04-28
2009-08-18
Le, John H (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
C250S281000, C250S282000, C435S006120, C702S030000, C702S109000
Reexamination Certificate
active
07577538
ABSTRACT:
A method for analyzing data from a mass spectrometer including obtaining calibrated mass spectral data involving at least one ion with its isotopes, by processing raw spectral data; obtaining library spectral data which has been processed to form calibrated library data; and performing a regression analysis, preferably using matrix operations, between the calibrated mass spectral data and the calibrated library data; and reporting at least one regression coefficient representative of a relative concentrations of a component in a sample which generated the raw spectral data. The invention is also directed to a mass spectrometer system that operates in accordance with the method, a data library of transformed mass spectra, and a method for producing the data library.
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Aker David
Cerno Bioscience LLC
Le John H
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