X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1992-12-03
1995-07-04
Dzierzynski, Paul M.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 6, 378901, G01N 23203
Patent
active
054307872
ABSTRACT:
Apparatus and methods for Compton scattering tomography employ a source of monoenergetic gamma rays and a detector capable of detecting the energy of scattered photons and determining the detector location both disposed on one side of an object to be imaged. Based on analysis of the measurement of the energy of the detected photons and the detector locations, a circle of possible scattering locations is determined as to each scattering event. By performance of a number of experiments as a function of detector location and energy, the density of the object can be reconstructed by filtering and back-projecting the data to yield an image responsive to variation in the density of the material of the object to be imaged.
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Angeli Michael de
Bruce David Vernon
Dzierzynski Paul M.
The United States of America as represented by the Secretary of
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