Compton-effect method and system for locating a plane separating

Details Compton-effect method and system for locating a plane separating Compton-effect method and system for locating a plane separating

1992-01-22

1993-03-16

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 86, G01B 1502

Patent

active

051951169

ABSTRACT:
A method and a system for enabling high accuracy measurements to be obtained of the location of a plane separating two media of different densities by using the Compton effect, and application thereof to measuring the thicknesses of layers. A measurement assembly constituted by a transmitter and a receiver of X-rays or gamma rays which are focused in emission and in reception irradiates an elementary volume of said media, and is displaced perpendicularly to the plane between said media, and a fifth signal is calculated representative of the extent by which the derivative of the detected signal relative to the displacement exceeds a threshold, after which the barycenter of displacements corresponding to the most recent sequence of said same-sign fifth signals is calculated, with the displacements being weighted by the corresponding one of said fifth signals.

REFERENCES:
patent: 4165460 (1979-08-01), Rose et al.
Patent Abstracts of Japan, vol. 7, No. 48, (P-178)(11983) Feb. 24, 1983.

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