Compressive sampling and signal inference

Details Compressive sampling and signal inference Compressive sampling and signal inference

2007-07-31

2009-11-10

Nguyen, Khai M (Department: 2819)

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

C356S303000, C356S305000, C356S310000, C356S328000, C356S334000

Reexamination Certificate

active

07616306

ABSTRACT:
An optical wavemeter includes a slit, a diffraction grating, a mask, a complementary grating, and a detector. A monochromatic source is incident on the slit. The diffraction grating produces an image of the slit in an image plane at a horizontal position that is wavelength dependent. The mask has a two-dimensional pattern of transmission variations and produces different vertical intensity channels for different spectral channels. The complementary grating produces a stationary image of the slit independent of wavelength. The detector measures vertical variations in intensity of the stationary image, and the mask is created so that the number of measurements made by the detector is less than the number of spectral channels sampled.

REFERENCES:
patent: 6870619 (2005-03-01), Tenhunen et al.
patent: 7196789 (2007-03-01), Senturia et al.

Affiliated with

Also associated with

Rating

Compressive sampling and signal inference does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Compressive sampling and signal inference, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Compressive sampling and signal inference will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4081393