Compressive conductors for semiconductor testing

Details Compressive conductors for semiconductor testing Compressive conductors for semiconductor testing

2007-02-06

2010-06-01

Hollington, Jermele M (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C439S824000

Reexamination Certificate

active

07728611

ABSTRACT:
An interconnect assembly electrically connecting two circuit members, which include respective arrays of electrical contacts for engagement with the interconnect assembly. The interconnect assembly comprises a plurality of electrical conductors, the plurality of conductors arranged in a spaced arrangement, the spaced arrangement of the conductors substantially corresponding to a spaced arrangement for the respective arrays of electrical contacts to provide contact between the conductors and the contact arrays and a carrier, including a socket and a retainer. The socket includes a plurality of apertures each receiving an upper portion of one of the plurality of conductors and the retainer includes a plurality of apertures each receiving a lower portion of one of the plurality of conductors; and the respective apertures are aligned axially with each other.

REFERENCES:
patent: 6634890 (2003-10-01), Peterson et al.
patent: 6758682 (2004-07-01), Kosmala
patent: 7102373 (2006-09-01), Yoshida
patent: 7279913 (2007-10-01), Wu et al.
patent: 7297004 (2007-11-01), Shuhart et al.
patent: 2008/0061809 (2008-03-01), Lee et al.
patent: 2008/0143366 (2008-06-01), Kurotori et al.

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