Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2005-12-21
2008-12-09
Nguyen, Dang T (Department: 2824)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185170, C365S185330
Reexamination Certificate
active
07463532
ABSTRACT:
Systems and methods in accordance with various embodiments can provide for comprehensive erase verification and defect detection in non-volatile semiconductor memory. In one embodiment, the results of erasing a group of storage elements is verified using a plurality of test conditions to better detect defective and/or insufficiently erased storage elements of the group. For example, the results of erasing a NAND string can be verified by testing charging of the string in a plurality of directions with the storage elements biased to turn on if in an erased state. If a string of storage elements passes a first test process or operation but fails a second test process or operation, the string can be determined to have failed the erase process and possibly be defective. By testing charging or conduction of the string in a plurality of directions, defects in any transistors of the string that are masked under one set of conditions may be exposed under a second set of bias conditions. For example, a string may pass an erase verification operation but then be read as including one or more programmed storage elements. Such a string can be defective and mapped out of the memory device.
REFERENCES:
patent: 5172338 (1992-12-01), Mehrotra et al.
patent: 5265059 (1993-11-01), Wells et al.
patent: 5347490 (1994-09-01), Terada et al.
patent: 5521865 (1996-05-01), Ohuchi et al.
patent: 5546351 (1996-08-01), Tanaka et al.
patent: 5570315 (1996-10-01), Tanaka et al.
patent: 5590074 (1996-12-01), Akaogi et al.
patent: 5602987 (1997-02-01), Harari et al.
patent: 5652719 (1997-07-01), Tanaka et al.
patent: 5719808 (1998-02-01), Harari et al.
patent: 5815439 (1998-09-01), Korsch et al.
patent: 5870334 (1999-02-01), Hemink et al.
patent: 5901089 (1999-05-01), Korsch et al.
patent: 5905344 (1999-05-01), Vrionis
patent: 5905461 (1999-05-01), Neher
patent: 5936890 (1999-08-01), Yeom
patent: 5949714 (1999-09-01), Hemink et al.
patent: 5969985 (1999-10-01), Tanaka et al.
patent: 5991206 (1999-11-01), Shin
patent: 5999446 (1999-12-01), Harari et al.
patent: 6011722 (2000-01-01), Bude et al.
patent: 6014330 (2000-01-01), Endoh et al.
patent: 6044013 (2000-03-01), Tanaka et al.
patent: 6081453 (2000-06-01), Iwahashi
patent: 6128242 (2000-10-01), Banba et al.
patent: 6134140 (2000-10-01), Tanaka et al.
patent: 6172906 (2001-01-01), Estakhri et al.
patent: 6208560 (2001-03-01), Tanaka et al.
patent: 6222767 (2001-04-01), Kendall et al.
patent: 6236609 (2001-05-01), Tanzawa et al.
patent: 6243839 (2001-06-01), Roohparvar
patent: 6282117 (2001-08-01), Tanaka et al.
patent: 6363010 (2002-03-01), Tanaka et al.
patent: 6373746 (2002-04-01), Takeuchi et al.
patent: 6373748 (2002-04-01), Ikehashi et al.
patent: 6418054 (2002-07-01), Hollmer
patent: 6434055 (2002-08-01), Tanaka et al.
patent: 6438037 (2002-08-01), Fastow et al.
patent: 6483750 (2002-11-01), Dallabora et al.
patent: 6498752 (2002-12-01), Hsu et al.
patent: 6512701 (2003-01-01), Hamilton et al.
patent: 6512702 (2003-01-01), Yamamura et al.
patent: 6519184 (2003-02-01), Tanaka et al.
patent: 6523132 (2003-02-01), Harari et al.
patent: 6545909 (2003-04-01), Tanaka et al.
patent: 6549464 (2003-04-01), Tanaka et al.
patent: 6549467 (2003-04-01), Roohparvar
patent: 6560143 (2003-05-01), Conley et al.
patent: 6562992 (2003-05-01), Hayashi et al.
patent: 6621740 (2003-09-01), Hosogane et al.
patent: 6665214 (2003-12-01), Cheah et al.
patent: 6684345 (2004-01-01), Harari et al.
patent: 6798698 (2004-09-01), Tanaka et al.
patent: 7009889 (2006-03-01), Tran et al.
patent: 7057933 (2006-06-01), Roohparvar
patent: 7068539 (2006-06-01), Guterman et al.
patent: 2002/0031038 (2002-03-01), Honda et al.
patent: 2002/0080660 (2002-06-01), Kanamitsu et al.
patent: 2002/0163840 (2002-11-01), Hiraki et al.
patent: 2003/0051093 (2003-03-01), Takeuchi
patent: 2003/0074152 (2003-04-01), Kessenich et al.
patent: 2003/0086295 (2003-05-01), Honda et al.
patent: 2003/0151960 (2003-08-01), Hiraki et al.
patent: 2003/0206438 (2003-11-01), Shibata et al.
patent: 2003/0206449 (2003-11-01), Harari et al.
patent: 2003/0214853 (2003-11-01), Hosono et al.
patent: 2005/0013169 (2005-01-01), Tanaka et al.
patent: 2005/0041515 (2005-02-01), Futatsuyama et al.
patent: 2005/0219909 (2005-10-01), Futatsuyama et al.
patent: 2006/0098493 (2006-05-01), Tran et al.
patent: 2006/0098495 (2006-05-01), Tran et al.
patent: 2006/0133156 (2006-06-01), Tran et al.
patent: 2006/0256622 (2006-11-01), Aritome
Non-final Office Action, United States Patent & Trademark Office, U.S. Appl. No. 11/316,162, filed Dec. 21, 2005, Jul. 26, 2007.
Non-final Office Action, United States Patent & Trademark Office, U.S. Appl. No. 11/316,475, filed Dec. 21, 2005, Apr. 10, 2007.
Response to Non-final Office Action, U.S. Appl. No. 11/316,162, filed Dec. 21, 2005, Jan. 29, 2008.
Final Office Action, United States Patent & Trademark Office, U.S. Appl. No. 11/316,475, filed Dec. 21, 2005, Jan. 4, 2008.
Non-Final Office Action, United States Patent & Trademark Office, U.S. Appl. No. 11/316,069, filed Dec. 21, 2005, Mar. 4, 2008.
Non-final Office Action, United States Patent & Trademark Office, U.S. Appl. No. 11/316,162, filed Dec. 21, 2005, Mar. 18, 2008.
Response to Non-Final Office Action, U.S. Appl. No. 11/316,069, filed Dec. 21, 2005, May 5, 2008.
Response to Final Office Action, U.S. Appl. No. 11/316,475, filed Dec. 21, 2005, May 5, 2008.
Response to Non-Final Office Action, U.S. Appl. No. 11/316,162, filed Dec. 21, 2005, May 6, 2008.
Non-Final Office Action, United States Patent & Trademark Office, U.S. Appl. No. 11/316,475 filed on Dec. 21, 2005, Jun. 2, 2008.
Notice of Allowance and Fee(s) Due, United States Patent & Trademark Office, U.S. Appl. No. 11/316,162 filed on Dec. 21, 2005, Jul. 24, 2008.
Non-Final Office Action, United States Patent & Trademark Office, U.S. Appl. No. 11/316,069 filed On Dec. 21, 2005, Sep. 4, 2008.
Chen Jian
Lutze Jeffrey W.
Ponnuru Kiran
Tran Dat
Wan Jun
Nguyen Dang T
SanDisk Corporation
Vierra Magen Marcus & DeNiro LLP
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