Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor
Reexamination Certificate
2006-11-07
2006-11-07
Crane, Sara (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Heterojunction device
Field effect transistor
C257S200000, C438S167000
Reexamination Certificate
active
07132699
ABSTRACT:
A compound semiconductor device has: a substrate; a GaN channel layer; an n-type AlqGa1−qN (0<q≦1) electron supply layer; an n-type GaN cap layer; a gate electrode disposed on the cap layer and forming a Schottky contact; recesses formed on both sides of the gate electrode on source and drain sides by at least partially removing the cap layer, the recesses having a bottom surface of a roughness larger than a roughness of a surface of the cap layer under the gate electrode; a source electrode disposed on the bottom surface of the recess on the source side; and a drain electrode disposed on the bottom surface of the recess on the drain side.
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Kikkawa Toshihide
Kimura Tokuharu
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