Composition for forming dielectric layer, MIM capacitor and...

Compositions – Barrier layer device compositions – Group vi element-containing

Reexamination Certificate

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C252S06230R, C438S240000, C438S238000, C438S239000, C438S778000, C438S780000, C438S781000, C438S785000, C438S787000, C438S790000, C257S296000, C257S306000

Reexamination Certificate

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11150231

ABSTRACT:
To provide a composition for forming a dielectric layer excellent in dielectric constant and withstand voltage properties, a MIM capacitor and a process for its production.A composition for forming a dielectric layer, which comprises fine particles of perovskite type dielectric crystal, glass frit, and a hydrolysable silicon compound or its oligomer, and a MIM capacitor comprising a substrate, and a bottom electrode layer, a dielectric layer having a structure such that fine particles of perovskite type dielectric crystal are dispersed in a silicon oxide matrix containing glass-forming ions and a top electrode, formed on the substrate in this order.

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