Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-01-11
2011-01-11
Tang, Minh N (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S757020, C324S758010
Reexamination Certificate
active
07868632
ABSTRACT:
An electronic device is moved into a first position with respect to probes for making electrical contact with the device. The electronic device is then moved into a second position in which the electronic device is pressed against the probes, compressing the probes. The movement into the second position includes two components. One component of the movement tends to press the electronic device against the probes, compressing the probes and inducing a stress in the probes. The second movement tends to reduce that stress. Test data are then communicated to and from the electronic device through the probes.
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Cooper Timothy E.
Eldridge Benjamin N.
Khandros Igor Y.
Martens Rod
Mathieu Gaetan L.
FormFactor Inc.
Kirton & McConkie
Nguyen Trung Q
Tang Minh N
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