Componet supplied with an analog value

Details Componet supplied with an analog value Componet supplied with an analog value

2006-06-28

2010-11-02

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

Reexamination Certificate

active

07825680

ABSTRACT:
An apparatus comprises at least one component arranged to be supplied with at least one analog value. In order to enable a testing of the at least one component, the apparatus further comprises at least one comparator configured to compare at least one analog value, which corresponds to at least one analog value supplied to the at least one component, with at least one analog value read from the at least one component. The comparator is moreover configured to provide a result of the comparison.

REFERENCES:
patent: 5576730 (1996-11-01), Shimada et al.
patent: 6847223 (2005-01-01), Nara et al.
patent: 6985003 (2006-01-01), Li et al.
patent: 2002/0070750 (2002-06-01), Fujita
patent: 2003/0151587 (2003-08-01), Yamashita
patent: 2005/0122300 (2005-06-01), Makuuchi et al.
patent: 2005/010600 (2005-02-01), None

Affiliated with

Also associated with

Rating

Componet supplied with an analog value does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Componet supplied with an analog value, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Componet supplied with an analog value will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4185018