Components for reducing background noise in a mass spectrometer

Details Components for reducing background noise in a mass spectrometer Components for reducing background noise in a mass spectrometer

2011-02-01

2011-02-01

Berman, Jack I (Department: 2881)

Radiant energy

With charged particle beam deflection or focussing

Magnetic lens

C250S399000, C250S281000

Reexamination Certificate

active

07880147

ABSTRACT:
Novel components reduce background noise caused by secondary ions generated by metastable entity bombardment in a mass spectrometric system. Layered structures for exit electrodes and deflector plates confine secondary ions in a local low-energy well, preventing them from entering the detector.

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“Notification of Transmittal of the International Search Report and the Written Opinion of the International Searching Authority, or the Declaration,” International Filing Date: Jan. 15, 2009, International Application No. PCT/US2009/000278, Applicant: Perkinelmer Health Sciences, Inc., Date of Mailing: Oct. 6, 2009, pp. 1-11.

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