Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2006-02-21
2006-02-21
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
Reexamination Certificate
active
07003425
ABSTRACT:
A method of measuring temperature of a component capable of emitting thermal radiation and reflecting background radiation having the steps of: providing a pyrometer for measuring the radiation from the component, characterised by coating a part of the component with a first emissivity coating and a part of the component with a different and second emissivity coating, each with known emissivities EHand ELrespectively, recording a first radiation measurement from the first emissivity coating RHand a second radiation measurement from the second emissivity coating RL, then calculating the true radiation RBladefrom the component from the equationRBlade=(RHEH-RLEH(1-EH1-EL))(1-ELEH(1-EH1-EL))and relate the RBladevalue to the true component temperature by calibration of the pyrometer.
REFERENCES:
patent: 4880314 (1989-11-01), Kienitz
patent: 5125739 (1992-06-01), Suarez-Gonzalez
patent: 5326173 (1994-07-01), Evans et al.
patent: 5688051 (1997-11-01), King
patent: 6027244 (2000-02-01), Champetier et al.
patent: 2003/0111615 (2003-06-01), Benne
patent: 2003/0236642 (2003-12-01), Timans
patent: 2 365 108 AB (1976-09-01), None
Bird Colin
Parrish Colin J
Bui Bryan
Manelli Denison & Selter PLLC
Pretlow Demetrius
Rolls-Royce plc
Taltavull W. Warren
LandOfFree
Component temperature measuring method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Component temperature measuring method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Component temperature measuring method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3634657