Component specific machine wear determination with x-ray...

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Reexamination Certificate

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C378S044000

Reexamination Certificate

active

10949962

ABSTRACT:
X-ray fluorescence analysis is used to determine wear of machine parts on a component-specific basis. The individual wetted wear surfaces of the machine are provided with a signature tagant composition, and as the components wear, the amounts of each tagant in the lubricating fluid are determined by the x-ray fluorescence analysis. An analysis system tracks the amounts of the tagants in the lubricating fluid, and with information of the signature tagant composition of each wear surface, calculates wear rate information for each of the wear surfaces. This component-specific wear information is then used in scheduling maintenance and predicting failures of the machine.

REFERENCES:
patent: 2315845 (1943-04-01), Ferris et al.
patent: 2939011 (1960-05-01), Bisso et al.
patent: 3751661 (1973-08-01), Packer et al.
patent: 3936192 (1976-02-01), Skala
patent: 4013953 (1977-03-01), Skala
patent: 4125769 (1978-11-01), Marten et al.
patent: 4388530 (1983-06-01), Lubecki et al.
patent: 4450576 (1984-05-01), Lubecki et al.
patent: 4620185 (1986-10-01), Plahmer
patent: 4683759 (1987-08-01), Skarsvaag et al.
patent: 4720842 (1988-01-01), Kira et al.
patent: 4795903 (1989-01-01), Clayton
patent: 4821301 (1989-04-01), Cocks et al.
patent: 5000036 (1991-03-01), Yellowley et al.
patent: 5187542 (1993-02-01), Madzsar
patent: 5194410 (1993-03-01), Calabro
patent: 5194910 (1993-03-01), Kirkpatrick, Jr. et al.
patent: 5497008 (1996-03-01), Kumakhov
patent: 5598451 (1997-01-01), Ohno et al.
patent: 5657363 (1997-08-01), Hossain et al.
patent: 5712891 (1998-01-01), Benony et al.
patent: 5982847 (1999-11-01), Nelson
patent: 5993298 (1999-11-01), Duescher
patent: 6012325 (2000-01-01), Ma
patent: 6080982 (2000-06-01), Cohen
patent: 6226347 (2001-05-01), Golenhofen
patent: 6285734 (2001-09-01), von Alfthan
patent: 6306319 (2001-10-01), Swain et al.
patent: 6408048 (2002-06-01), Opsal et al.
patent: 6510726 (2003-01-01), Subramanyan et al.
patent: 2002/0083761 (2002-07-01), Swain et al.
patent: 2003/0128805 (2003-07-01), Shepard et al.

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