Component measuring apparatus with multiple component multiple p

Details Component measuring apparatus with multiple component multiple p Component measuring apparatus with multiple component multiple p

1985-11-27

1987-05-19

Martin, Jr., William D.

Geometrical instruments

Gauge

Pitchometer

33503, 33549, 33557, G01B 728

Patent

active

046656251

ABSTRACT:
A component inspection apparatus includes a component holder mounted on a compound slide structure. Two arrays of gauging elements are provided on a mutually perpendicularly movable slide. These arrays can be adjusted on the slide and each array includes a plurality of separate gauge elements movable by contact with the work and at least one linear transducer connected to each gauge element. In use, the slides are moved to a plurality of predetermined positions in a sequence. The displacements of the probe elements at each position are noted and compared with displacements obtained when the same sequence of positions is followed while a master componet is in the holder.

REFERENCES:
patent: 2748490 (1956-06-01), Tandler
patent: 2858615 (1958-11-01), Aller
patent: 3023506 (1962-03-01), Tandler et al.
patent: 3869802 (1975-03-01), Pirner
patent: 4053989 (1977-10-01), Yamaji et al.
patent: 4221053 (1980-09-01), Bobel, II et al.
patent: 4520569 (1985-06-01), Ireland

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