Component detection method

Details Component detection method Component detection method

1998-04-29

1999-02-16

Kelley, Christopher S

Image analysis

Applications

Manufacturing or product inspection

382168, G06K 900

Patent

active

058728635

ABSTRACT:
It is intended to accurately detect the centerline or center of electronic component by relieving effects of brightness or darkness or the like caused by the shape or color of the component, irregularity on the surface or how illuminance is projected on the component through statistical processing. To this end, the present invention comprises a first step for determining edge points of opposing sides of said component, a second step for determining two-dimensional coordinate axes which are established to make a deflection angle of said component zero, a third step for projecting the center position of two edge points in total each of which is arbitrarily selected from each side to a coordinate axis of said two-dimensional coordinate axes orthogonal to said opposing sides, and creating a histogram on said coordinate axis by projecting and adding the positions of center repeatedly obtained onto said coordinate axis, and a fourth step for detecting the peak position of the histogram obtained from the result of processing of said third step, and determining a line passing through the peak position and parallel to said opposing sides as the centerline of component.

REFERENCES:
patent: 4981372 (1991-01-01), Morimoto et al.
patent: 5185811 (1993-02-01), Beess et al.
patent: 5189707 (1993-02-01), Suzuki et al.
patent: 5513277 (1996-04-01), Huttenloches

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