Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate
2007-01-19
2008-11-11
Lefkowitz, Edward (Department: 2855)
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
C374S163000, C327S512000
Reexamination Certificate
active
07448797
ABSTRACT:
A component arrangement is disclosed herein comprisinga temperature sensor integrated in a semiconductor body, said temperature sensor being designed to generate a first temperature signal dependent on a temperature in the semiconductor body;a control device comprising a control amplifier, which has a first and a second input and an output, and comprising a low-pass filter having an input and an output, the input of the low-pass filter being coupled to the output of the control amplifier, the first input of the control amplifier being coupled to the temperature sensor and the second input of the control amplifier being coupled to the output of the low-pass filter; andan output, which is coupled to the output of the control amplifier and at which a second temperature signal is available.A method for determining the temperature in a semiconductor component is also disclosed herein.
REFERENCES:
patent: 4413917 (1983-11-01), Cooper
patent: 4475823 (1984-10-01), Stone
patent: 7322743 (2008-01-01), Gozloo et al.
patent: 2008/0082291 (2008-04-01), Jeong et al.
patent: 1 285 841 (2003-02-01), None
Infineon - Technologies AG
Jagan Mirellys
Lefkowitz Edward
Maginot Moore & Beck
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