Compliant contract structures, contactor cards and test...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Details

C324S755090

Reexamination Certificate

active

07030632

ABSTRACT:
A compliant contact structure and contactor card for operably coupling with a semiconductor device to be tested includes a substantially planar substrate with a compliant contact formed therein. The compliant contact structure includes a portion fixed within the substrate and at least another portion integral with the fixed portion, laterally unsupported within a thickness of the substrate and extending beyond a side thereof. Dual-sided compliant contact structures, methods of forming compliant contact structures, a method of testing a semiconductor device and a testing system are also disclosed.

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patent: 6268015 (2001-07-01), Mathieu et al.
patent: 6466043 (2002-10-01), Khoury et al.
patent: 6475822 (2002-11-01), Eldridge et al.

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