Complex probe card for testing a semiconductor wafer

Details Complex probe card for testing a semiconductor wafer Complex probe card for testing a semiconductor wafer

1984-05-23

1986-01-28

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, 324158F, G01R 106, G01R 3102

Patent

active

045674337

ABSTRACT:
A probe card includes a printed circuit plate having an aperture at the center thereof and a ring fixed around said aperture on either side of the plate. The ring being adapted to support probe needles in radial arrays with respect to the aperture. Each of the arrays has a multilayer of probe needles which have their terminal tips aligned on a plane in parallel with the plate and their opposite terminal ends connected to the printed circuit for external connection.

REFERENCES:
Altonen et al.; "Cantilever Probe"; IBM Tech. Dis. Bull.; vol. 24; No. 6; Nov. 1981; p. 2687.

Affiliated with

Also associated with

Rating

Complex probe card for testing a semiconductor wafer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Complex probe card for testing a semiconductor wafer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Complex probe card for testing a semiconductor wafer will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1308762