Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2005-06-07
2005-06-07
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C702S022000, C702S030000, C702S031000, C702S032000, C700S109000, C700S110000, C700S121000
Reexamination Certificate
active
06904384
ABSTRACT:
A complex multivariate analysis system is provided. The system has a storage module, a selecting module, an analyzing module, a correlation searching module and a reporting module. The storage module includes a first database and a second database. The first database records at least two data sets, each of the data sets including a plurality of items associated with a manufacturing process and data of the items. The second database records correlations of the items between the two data sets. The selecting module selects a first item from a first data set. The analyzing module analyzes the first item selected by the selecting module and determines whether the data of the first item conform to specifications or not. The correlation searching module searches the second database when the analyzing module determines that the data of the first item do not conform to the specifications, and selects a second item correlated to the first item from a second data set. Following that, the analyzing module analyzes the second item and determines whether the data of the second item conform to specifications or not.
REFERENCES:
patent: 5479340 (1995-12-01), Fox et al.
patent: 5862054 (1999-01-01), Li
patent: 5864773 (1999-01-01), Barna et al.
patent: 5903890 (1999-05-01), Shoji et al.
patent: 6153115 (2000-11-01), Le et al.
patent: 6368975 (2002-04-01), Balasubramhanya et al.
patent: 6413867 (2002-07-01), Sarfaty et al.
patent: 6521080 (2003-02-01), Balasubramhanya et al.
patent: 6589869 (2003-07-01), Sarfaty et al.
patent: 2004/0049898 (2004-03-01), Imai et al.
Hsu Winston
Powerchip Semiconductor Corp.
Tsai Carol S. W.
LandOfFree
Complex multivariate analysis system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Complex multivariate analysis system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Complex multivariate analysis system and method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3516707