Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2006-12-20
2008-08-19
Barlow, Jr., John E. (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C709S220000, C709S221000, C709S222000, C709S223000, C709S224000, C709S225000, C714S004110, C714S037000, C714S047300, C340S506000
Reexamination Certificate
active
07415391
ABSTRACT:
Complex event evaluation systems and methods are disclosed. A mathematics model for complex events and corresponding factors, and calculates a critical level of respective complex events according to weightings of respective factors in the mathematics model are provided. If several complex events occur simultaneously, a priority of respective complex events is calculated according to the historic occurrence of respective complex events. The critical level and priority of respective complex events are provided to users for decision making. Additionally, the mathematics model is established and adjusted according to the feedback scores for complex events.
REFERENCES:
patent: 7213068 (2007-05-01), Kohli et al.
Chen Pin-Chan
Hsu Chih-Hao
Huang Wen-Ju
Li Jen-Feng
Barlow Jr. John E.
Birch & Stewart Kolasch & Birch, LLP
Institute for Information Industry
Kundu Sujoy K
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