Compensation for voltage drop in automatic test equipment

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S1540PB

Reexamination Certificate

active

07737715

ABSTRACT:
Providing reliable testing of a device under test (DUT) by compensating for a reduced voltage inside the device without changing the internal circuitry of the device. The DUT has multiple connection terminals for connecting to the test equipment including at least first and second power connection terminals that both connect to an internal power bus of the DUT. An adapter board connects to the multiple connection terminals of the DUT via a removably attachable socket which holds the DUT. A tester supplies power to the DUT through the adapter board. The adapter board is configured to supply power from the tester to the DUT through the first power connection terminal and to monitor voltage at the second power connection terminal. The tester includes a compensation unit which controls power based on the voltage monitored at the second power connection terminal.

REFERENCES:
patent: 5101153 (1992-03-01), Morong
patent: 5519331 (1996-05-01), Cowart et al.
patent: 5563509 (1996-10-01), Small
patent: 5617035 (1997-04-01), Swapp
patent: 5909034 (1999-06-01), Soldavini et al.
patent: 5917331 (1999-06-01), Persons
patent: 6077091 (2000-06-01), McKenna-Olson et al.
patent: 6087895 (2000-07-01), Ono
patent: 6220884 (2001-04-01), Lin
patent: 6331770 (2001-12-01), Sugamori
patent: 6462570 (2002-10-01), Price et al.
patent: 6489791 (2002-12-01), Tsujii
patent: 6747470 (2004-06-01), Muhtaroglu et al.
patent: 6828775 (2004-12-01), Chow et al.
patent: 6885213 (2005-04-01), Sunter
patent: 6891384 (2005-05-01), Mardi et al.
patent: 6970798 (2005-11-01), Cao et al.
patent: 7046027 (2006-05-01), Conner
patent: 7084659 (2006-08-01), Delucco et al.
patent: 7141994 (2006-11-01), Akram
patent: 7288951 (2007-10-01), Bailey et al.
patent: 2001/0013790 (2001-08-01), Kusumoto
patent: 2002/0186037 (2002-12-01), Eldridge et al.
patent: 2004/0051551 (2004-03-01), Sunter
patent: 2005/0285613 (2005-12-01), Isakharov et al.
patent: 2194863 (1988-03-01), None
patent: 2006/068966 (2006-06-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Compensation for voltage drop in automatic test equipment does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Compensation for voltage drop in automatic test equipment, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Compensation for voltage drop in automatic test equipment will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4244200

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.