Compensation for test signal degradation due to DUT fault

Details Compensation for test signal degradation due to DUT fault Compensation for test signal degradation due to DUT fault

2005-11-15

2005-11-15

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

06965248

ABSTRACT:
An electronic device tester channel transmits a single test signal to multiple terminals of electronic devices under test (DUTs) through a set of isolation resistors. The tester channel employs feedback to automatically adjust the test signal voltage to compensate for affects of faults at any of the DUT terminals to prevent the faults from substantially affecting the test signal voltage.

REFERENCES:
patent: 5101153 (1992-03-01), Morong, III
patent: 6028438 (2000-02-01), Gillette

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