Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1982-09-20
1984-04-17
Ruehl, Charles A.
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
73777, 7386267, G01B 718, G01D 304
Patent
active
044427174
ABSTRACT:
Compensating apparatus for a shear gage transducer employing a piezoresistor. The shear gage transducer or sensor is of a cross-shaped planar configuration where a lack of symmetry in structure or in fabrication undesirably provides offsets at the output terminals associated with the horizontal cross arm. The compensating apparatus includes a series chain of resistors positioned between selected terminals of said sensor to provide a desired null output voltage over a temperature operating range. Further embodiments depict a shear sensor having a unique contact configuration to enable resistive compensation of undesired offsets.
REFERENCES:
patent: 3123788 (1964-03-01), Pfann et al.
patent: 3213681 (1965-10-01), Pearson
patent: 3922597 (1975-11-01), Nagase
patent: 4331035 (1982-05-01), Eisele et al.
patent: 4333349 (1982-06-01), Mallon et al.
Kurtz Anthony D.
Mallon Joseph R.
Kulite Semiconductor Products Inc.
Plevy Arthur L.
Ruehl Charles A.
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