Dynamic information storage or retrieval – Specific detail of information handling portion of system – Electrical modification or sensing of storage medium
Reexamination Certificate
2007-06-26
2007-06-26
Tran, Thang V. (Department: 2627)
Dynamic information storage or retrieval
Specific detail of information handling portion of system
Electrical modification or sensing of storage medium
Reexamination Certificate
active
10898122
ABSTRACT:
A storage device includes a storage medium and a probe to form perturbations in the storage medium. The storage device further includes a circuit to cause heating of the probe to perform an access operation, the circuit to compensate for variations in a temperature of the probe in performing the access operation.
REFERENCES:
patent: 5345815 (1994-09-01), Albrecht et al.
patent: 5432771 (1995-07-01), Shido et al.
patent: 5546374 (1996-08-01), Kuroda et al.
patent: 5835477 (1998-11-01), Binnig et al.
patent: 5856967 (1999-01-01), Mamin et al.
patent: 6233206 (2001-05-01), Hamann et al.
patent: 6249747 (2001-06-01), Binnig et al.
patent: 6370107 (2002-04-01), Hosaka et al.
patent: 6473361 (2002-10-01), Chen et al.
patent: 6757235 (2004-06-01), Wickramasinghe et al.
patent: 6950385 (2005-09-01), Chiba et al.
patent: 2004/0114490 (2004-06-01), Antonakopoulos et al.
patent: 2005/0047307 (2005-03-01), Frommer et al.
patent: 2005/0259503 (2005-11-01), Hilton
Vettiger and Binnig, Scientific American, “The Nanodrive Project,” pp. 47-51, 53 (Jan. 2003).
Hilton Richard L.
Mejia Robert G.
Hewlett--Packard Development Company, L.P.
Tran Thang V.
LandOfFree
Compensating for variations in the temperature of a probe of... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Compensating for variations in the temperature of a probe of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Compensating for variations in the temperature of a probe of... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3882386