Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate
2011-05-24
2011-05-24
Toatley, Gregory J (Department: 2877)
Optics: measuring and testing
By light interference
Using fiber or waveguide interferometer
Reexamination Certificate
active
07948633
ABSTRACT:
An optical device under test (DUT) is interferometrically measured. The DUT can include one or more of an optical fiber, an optical component, or an optical system. First interference pattern data for the DUT is obtained for a first path to the DUT, and second interference pattern data for the DUT is obtained for a second somewhat longer path to the DUT. Because of that longer length, the second interference pattern data is delayed in time from the first interference pattern data. A time varying component of the DUT interference pattern data is then identified from the first and second interference pattern data. The identified time varying component is used to modify the first or the second interference pattern data to compensate for the time-varying phase caused by vibrations, etc. One or more optical characteristics of the DUT may then be determined based on the modified interference pattern data.
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Froggatt Mark
Gifford Dawn K.
Luna Innovations Inc.
Nixon & Vanderhye P.C.
Richey Scott M
Toatley Gregory J
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