Compensated high temperature strain gage

Details Compensated high temperature strain gage Compensated high temperature strain gage

1992-08-12

1994-12-27

Williams, Hezron E.

Measuring and testing

Specimen stress or strain, or testing by stress or strain...

Specified electrical sensor or system

73775, 296211, G01B 716

Patent

active

053754743

ABSTRACT:
A device for measuring strain in substrates at high temperatures in which the thermally induced apparent strain is nulled. Two gages are used, one active gage and one compensating gage. Both gages are placed on the substrate to be gaged; the active gage is attached such that it responds to mechanical and thermally induced apparent strain while the compensating gage is attached such that it does not respond to mechanical strain and measures only thermally induced apparent strain. A thermal blanket is placed over the two gages to maintain the gages at the same temperature. The two gages are wired as adjacent arms of a Wheatstone bridge which nulls the thermally induced apparent strain giving a true reading of the mechanical strain in the substrate.

REFERENCES:
patent: 2344642 (1944-03-01), Ruge
patent: 2626338 (1953-01-01), Mitchell
patent: 3314033 (1967-04-01), Wnuk, Jr.
patent: 4707399 (1987-11-01), Rambosek

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