Compensated directional resistivity measurements

Details Compensated directional resistivity measurements Compensated directional resistivity measurements

2011-08-02

2011-08-02

LeDynh, Bot L (Department: 2858)

Electricity: measuring and testing

Of geophysical surface or subsurface in situ

With radiant energy or nonconductive-type transmitter

C324S346000

Reexamination Certificate

active

07990153

ABSTRACT:
A method for making directional resistivity measurements includes sequentially transmitting first and second axial and transverse electromagnetic waves in a borehole and receiving substantially pure axial and transverse components of each of the transmitted waves. A composite ratio of the received components is computed and may be utilized as an indicator of various formation parameters. The invention advantageously provides for the acquisition of compensated directional resistivity measurements.

REFERENCES:
patent: 5045795 (1991-09-01), Gianzero et al.
patent: 6181138 (2001-01-01), Hagiwara et al.
patent: 6297639 (2001-10-01), Clark et al.
patent: 6476609 (2002-11-01), Bittar
patent: 6509738 (2003-01-01), Minerbo et al.
patent: 6556015 (2003-04-01), Omeragic et al.
patent: 6566881 (2003-05-01), Omeragic et al.
patent: 6573722 (2003-06-01), Rosthal et al.
patent: 6765386 (2004-07-01), Gianzero et al.
patent: 6819110 (2004-11-01), Omeragic et al.
patent: 6836218 (2004-12-01), Frey et al.
patent: 6903553 (2005-06-01), Itskovich et al.
patent: 6911824 (2005-06-01), Bittar
patent: 6937022 (2005-08-01), Itskovich et al.
patent: 6969994 (2005-11-01), Minerbo et al.
patent: 6998844 (2006-02-01), Omeragic et al.
patent: 7003401 (2006-02-01), Haugland
patent: 7019528 (2006-03-01), Bittar
patent: 7038457 (2006-05-01), Chen et al.
patent: 7057392 (2006-06-01), Wang et al.
patent: 7138803 (2006-11-01), Bittar
patent: 7202670 (2007-04-01), Omeragic et al.
patent: 7265552 (2007-09-01), Bittar
patent: 7269515 (2007-09-01), Tabarovsky et al.
patent: 7274991 (2007-09-01), Tabarovsky et al.
patent: 7286091 (2007-10-01), Chen et al.
patent: 7345487 (2008-03-01), Bittar et al.
patent: 7353613 (2008-04-01), Bartel et al.
patent: 7382135 (2008-06-01), Li et al.
patent: 7385400 (2008-06-01), Moore
patent: 7414407 (2008-08-01), Wang et al.
patent: 7436184 (2008-10-01), Moore
patent: 7463035 (2008-12-01), Merchant et al.
patent: 7471088 (2008-12-01), Yu et al.
patent: 2007/0257677 (2007-11-01), Wang
patent: 2008/0068022 (2008-03-01), Peter et al.
patent: 2008/0074336 (2008-03-01), Signorelli et al.
patent: 2008/0078580 (2008-04-01), Bittar
patent: 2008/0158082 (2008-07-01), Wang et al.
patent: 2008/0246486 (2008-10-01), Forgang et al.
patent: 2008/0290873 (2008-11-01), Homan et al.
patent: 2009/0015261 (2009-01-01), Yang et al.
International Search Report and Written Opinion dated Dec. 23, 2010 for corresponding PCT application No. PCT/US2010/034285 filed May 11, 2010.
Fang, S., et al.; “Determination of structural dip and azimuth from LWD azimuthal propagation resistivity measurements in anisotropic formations”. 2008 SPE Annual Technical Conference and Exhibition, Denver, CO, Sep. 21-24, 2008.
Li, Q., et al.; “New directional electromagnetic tool for proactive geosteering and accurate formation evaluation while drilling”. SPWLA 46th Annual Logging Symposium, Jun. 26-29, 2005, pp. 1-16.

Affiliated with

Also associated with

Rating

Compensated directional resistivity measurements does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Compensated directional resistivity measurements, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Compensated directional resistivity measurements will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2618880