Compensated densitometer

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection

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Details

307230, 328145, 356206, G01N 2122

Patent

active

040800750

ABSTRACT:
The output of a test light of a densitometer is divided into a test beam and a reference beam. The test beam is caused to traverse film samples, and impinge on a detector that produces a signal responsive to the intensity of the received light. A second detector is arranged to receive the reference beam, which does not traverse the film sample. A measuring system is responsive to the output of the first detector, and utilizes the output of the second detector to compensate for variations in the intensity of the test light.

REFERENCES:
patent: 3320530 (1967-05-01), Pearlman
patent: 3528749 (1970-09-01), Bower
patent: 3887281 (1975-06-01), Kurita et al.
patent: 3918815 (1975-11-01), Gadbois
patent: 3970393 (1976-07-01), Krygeris et al.

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