Semiconductor device manufacturing: process – Including control responsive to sensed condition
Reexamination Certificate
2003-05-19
2008-11-18
Fourson, George (Department: 2823)
Semiconductor device manufacturing: process
Including control responsive to sensed condition
C438S015000, C438S106000, C438S127000, C427S208200, C347S176000
Reexamination Certificate
active
07452732
ABSTRACT:
A laser marking apparatus and method for marking the surface of a semiconductor chip are described herein. A laser beam is directed to a location on the surface of the chip where a laser-reactive marking material, such as a pigment containing epoxy, is present. The heat associated with the laser beam causes the laser-reactive marking material to fuse to the surface of the chip, creating a visibly distinct mark in contrast to the rest of the surface of the chip. Only reactive material contacted by the laser fuses to the chip surface and the remaining residue on the non-irradiated portion can be readily removed.
REFERENCES:
patent: 3751587 (1973-08-01), Insler et al.
patent: 4148057 (1979-04-01), Jesse
patent: 4375025 (1983-02-01), Carlson
patent: 4561541 (1985-12-01), Lawrence
patent: 4585931 (1986-04-01), Duncan et al.
patent: 4594263 (1986-06-01), Folk et al.
patent: 4638144 (1987-01-01), Latta, Jr.
patent: 4707722 (1987-11-01), Folk et al.
patent: 4719502 (1988-01-01), Ikeya et al.
patent: 4753863 (1988-06-01), Spanjer
patent: 4791267 (1988-12-01), Yokoyama et al.
patent: 4861620 (1989-08-01), Azuma et al.
patent: 4945204 (1990-07-01), Nakamura et al.
patent: 5030551 (1991-07-01), Herren et al.
patent: 5157412 (1992-10-01), Kleinschmidt et al.
patent: 5206280 (1993-04-01), Williams
patent: 5256578 (1993-10-01), Corley et al.
patent: 5262470 (1993-11-01), Shimotsuma et al.
patent: 5329090 (1994-07-01), Woelki et al.
patent: 5346802 (1994-09-01), Ohbachi et al.
patent: 5357077 (1994-10-01), Tsuruta
patent: 5373039 (1994-12-01), Sakai et al.
patent: 5413629 (1995-05-01), Yasui et al.
patent: 5445923 (1995-08-01), Takahashi et al.
patent: 5567066 (1996-10-01), Paranjpe
patent: 5686759 (1997-11-01), Hyde et al.
patent: 5691757 (1997-11-01), Hayashihara et al.
patent: 5757313 (1998-05-01), Meneghini et al.
patent: 5838361 (1998-11-01), Corbett
patent: 5985377 (1999-11-01), Corbett
patent: 6108026 (2000-08-01), Corbett
patent: 6113992 (2000-09-01), Corbett
patent: 6217949 (2001-04-01), Corbett
patent: 6342912 (2002-01-01), Corbett
patent: 6429890 (2002-08-01), Corbett
patent: 6461690 (2002-10-01), Corbett
patent: 404116955 (1992-04-01), None
Fourson George
Micro)n Technology, Inc.
TraskBritt
LandOfFree
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